The hottest TriQuint uses nipxi and LabV

2022-09-21
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TriQuint uses Ni PXI and LabVIEW to shorten the characterization time of RF power amplifier

industry: ate/instrument, rf/communications, semiconductor

Products:

TestStand, LabVIEW, pxi-4071, pxie-5442, pxi-5690, Ni pxie-5673, Ni pxie-5122, pxi-2596. In order to better meet the needs of the market, pxie-5663, Ni pxi-4110

challenges:

without sacrifice.When the measurement accuracy or equipment cost is increased, Shorten the characterization time of increasingly complex wireless power amplifier (PA)

solution:

using NI LabVIEW software and Ni PXI modular instruments to develop a power amplifier characterization system allows us to reduce the cost of assets and equipment, power consumption and physical space, while improving the test throughput by 10 times

"using Ni PXI, we can shorten the characterization time of new components from two weeks to about one day."

about TriQuint semiconductor

TriQuint is a leader in high-performance RF solutions. Its products involve complex mobile devices, national defense and aerospace applications, and network infrastructure. TriQuint now provides innovative solutions for organizations around the world by using GaAs, Gan, saw and BAW technologies. Engineers and scientists use TriQuint's innovation to improve the performance of products and reduce the total cost of their applications

challenges of existing power amplifier characterization technology

although radio frequency power amplifiers are mainly designed to work in single band and single mode, modern power amplifiers need to meet more diverse needs. In fact, the design of modern power amplifier can work in eight or more frequency bands, and can be used for many modulation types including GSM, edge, WCDMA, hspa+, LTE, etc

we use Ni PXI and LabVIEW to reduce the size, cost and power consumption of the characterization system, and shorten the total characterization time

at TriQuint semiconductor, we need to test increasingly complex components under a variety of frequencies, voltage levels, temperatures and power ranges. The complete characterization process of a typical component requires about 30000 to 40000 lines of data to fully test the design. Using traditional rack RF test equipment, each row of data needs about 10 seconds to collect, so each independent component needs more than 110 hours to test

design an alternative PXI test system

to solve the challenge of shortening the characterization test time of RF components, we have developed a power amplifier characterization test system based on Ni PXI, LabVIEW and Ni TestStand. Our power amplifier test bench includes the following instruments:

Ni pxie-5673 6.6 GHz vector signal generator

Ni pxie-5663 6.6 GHz vector signal analyzer

ni pxi-5691 8 GHz programmable RF amplifier

Ni pxie-5122 100 ms/s high-speed digitizer

Ni pxi-4110 programmable power supply

Ni pxi-4130 power source measurement unit

ni pxi-2596 dual 6X1 26 GHz Multiplexer

100 mbit/s digital i/o module

traditional rack spectrum analyzer

external power meter, power supply

LabVIEW

Ni TestStand

Ni gsm/edge measurement Suite

NI Measurement Suite for wcdma/hspa+

about 75% of the raw aluminum produced worldwide is still being recycled. LabVIEW software has updated the existing test plan, and in Ni PXI.Complete the same measurement sequence on the test bench. Because the measurement speed on the PXI test system is faster, we configure the characteristic sequence to use the PXI test bench as much as possible, and only use the traditional rack instrument when necessary

advantages of Ni PXI

the main reason for deciding to use PXI is that it can achieve higher measurement speed without sacrificing measurement accuracy. Usually, on the previous RF amplifier test bench, the time required for RF measurement accounts for the vast majority of the entire characterization time. PXI uses high-speed data bus, high-performance multi-core CPU and parallel measurement algorithm to achieve the fastest possible test speed. In addition, the Ni gsm/edge Measurement Suite and the collaborative operation of different components. The NI Measurement Suite for wcdma/hspa+ uses synthetic measurements, and all measurements can be completed using a set of i/q data. Using these toolkits, we can measure power amplifier characteristics such as gain, efficiency, flatness, ACP, ACLR, EVM, and PVT

results obtained using PXI

by using PXI to complete most of the measurements of the power amplifier test bench, we shortened the characterization time of the power amplifier from two weeks to about 24 hours. In addition, we have observed significant improvements in measurement time in each GSM, edge, and WCDMA measurement test. Table 1 compares the measurement time and speed improvement of traditional test bench and PXI test bench

in a single measurement sequence, the completion of PXI test bench is 6 to 11 times faster. The time is measured based on 100 frames

conclusion

because we use the Ni PXI modular instrument, the characterization time of the RF power amplifier is significantly shortened without sacrificing the measurement accuracy. We have built a new PXI test system at the same or lower cost than the original traditional instrument solutions. We also expect to use Ni PXI in future test systems

Author Information:

Gary Shipley

TriQuint Semiconductor (end)

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